Pre-AdMet Workshop
A pre-AdMet workshop on the theme “Nexus of Dimensional Metrology and Material Characterization” is scheduled for 28 October 2026 at AEAMT, CMTI, Bengaluru.
The workshop will comprise parallel sessions on the following subthemes:
- Non-Destructive Testing for Semiconductor Metrology
- Advanced Materials Processing & Characterization Techniques
- Dimensional and Optical Metrology
The detailed session-wise programmes are given below.
Subtheme I: Non-Destructive Testing for Semiconductor Metrology
| Time | Particulars |
|---|---|
| 09:00–09:30 | Registration for Pre-AdMet Workshop |
| 09:30–09:40 | Inauguration and Workshop Overview – AdMet 2026 |
| 09:40–10:00 | Keynote Lecture |
| 10:00–10:30 | High Tea and Photograph |
| 10:30–11:15 | Introduction to Non-Destructive Testing for Semiconductor Metrology |
| 11:15–12:30 | Working Principle of 3D X-ray Microscopy |
| 12:30–13:00 | 3D X-ray Microscopy Imaging: Workflow |
| 13:00–14:00 | Lunch |
| 14:00–15:30 | Demo I: X-ray Microscopy Scanning, 3D Reconstruction, and Analysis |
| 15:30–15:45 | Hi-Tea |
| 15:45–17:15 | Demo II: X-ray Diffraction and X-ray Fluorescence |
Subtheme II: Advanced Materials Processing & Characterization Techniques
| Time | Particulars |
|---|---|
| 09:00–09:30 | Registration for Pre-AdMet Workshop |
| 09:30–09:40 | Inauguration and Workshop Overview – AdMet 2026 |
| 09:40–10:00 | Keynote Lecture |
| 10:00–10:30 | Tea Break & Photo Session |
| 10:30–11:15 | Demo 1: Spectroscopic Techniques – FTIR, Ellipsometry & Raman Analysis (Venue 1) |
| 11:15–12:30 | Demo 2: Scanning Electron Microscopy |
| 12:30–13:00 | Demo 3: Advanced non-destructive testing (Phased Array Ultrasonic Testing – PAUT) |
| 13:00–14:00 | Lunch |
| 14:00–15:00 | Demo 5: Static mechanical testing of Metallic materials (cryo to elevated temperatures) |
| 15:00–15:30 | Demo 6: Advanced Materials Characterization – In operando X-ray Diffraction |
| 15:30–15:45 | Tea Break |
| 15:50–16:35 | Demo 7: Spectroscopic Techniques in Materials Characterization – OES & WDXRF |
| 16:35–17:00 | Demo 8: Gas analysis – Carbon Sulfur & Oxygen Nitrogen Hydrogen |
| 17:05–17:30 | Demo 9: Industrial coating thickness measurement |
Subtheme III: Dimensional and Optical Metrology
| Time | Particulars |
|---|---|
| 09:00–09:30 | Registration for Pre-AdMet Workshop |
| 09:30–09:40 | Inauguration and Workshop Overview – AdMet 2026 |
| 09:40–10:00 | Keynote Lecture |
| 10:00–10:30 | High Tea and Photograph |
| 10:30–11:15 | Advances in Dimensional Metrology |
| 11:15–12:30 | Optical Metrology with Low Coherence Interferometry: From Principle to Practice |
| 12:30–13:00 | Measurement Methodology for Precision Ball Screw Assemblies |
| 13:00–14:00 | Lunch |
| 14:00–14:30 | Demo 1: Comparative measurement using CMM |
| 14:30–15:00 | Demo 2: Gear measurement |
| 15:00–15:30 | Demo 3: Ball Screw lead error measurement |
| 15:30–15:45 | Hi Tea |
| 15:45–16:15 | Demo 4: Optical Profiler / White-light Interferometer |
| 16:15–16:45 | Demo 5: Flatness Measurement using a Fizeau Interferometer |
| 16:45–17:15 | Demo 6: Optical Metrology: A COMSOL Multiphysics Simulation Walkthrough |
| 17:15–17:30 | Discussion and conclusion |